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Results 1 to 25 of 153

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Numerical simulation of the thermal oxidation of silicon in N2O ambientGADIYAK, G. V; KOROBITSINA, J. L.Solid-state electronics. 1995, Vol 38, Num 5, pp 1113-1114, issn 0038-1101Article

The study of mechanical behavior on the interface between calcar-defect femur and restorations by means of finite element analysisSHI, X. H; JIANG, W; CHEN, H. Z et al.Applied surface science. 2008, Vol 255, Num 2, pp 290-292, issn 0169-4332, 3 p.Conference Paper

Investigating the effects of the interface defects on the gate leakage current in MOSFETsMAO, Ling-Feng.Applied surface science. 2008, Vol 254, Num 20, pp 6628-6632, issn 0169-4332, 5 p.Article

Correlation between interfacial defects and ferromagnetism of BaTiO3 nanocrystals studied by positron annihilationCHEN, Zhi-Yuan; CHEN, Z. Q; WANG, D. D et al.Applied surface science. 2011, Vol 258, Num 1, pp 19-23, issn 0169-4332, 5 p.Article

A model of martensite formation in terms of interfacial defect mechanismsPOND, R. C; CELOTTO, S; HIRTH, J. P et al.Journal de physique. IV. 2003, Vol 112, pp 111-114, issn 1155-4339, 4 p., 1Conference Paper

Hot-electron-induced defects at the Si-SiO2 interface at high fields at 295 and 77 KFISCHETTI, M. V; RICCO, B.Journal of applied physics. 1985, Vol 57, Num 8, pp 2854-2859, issn 0021-8979, part 1Article

A criterion for determining the optimum value of twist in the topological modelZHAOZHAO WEI; XIAO MA; XINPING ZHANG et al.Philosophical magazine letters. 2014, Vol 94, Num 4-6, pp 288-295, issn 0950-0839, 8 p.Article

Origin of anomalous magnetite properties in crystallographic matched heterostructures: Fe3O4(111)/MgAl2O4(111)GILKS, D; LARI, L; NAUGHTON, J et al.Journal of physics. Condensed matter (Print). 2013, Vol 25, Num 48, issn 0953-8984, 485004.1-485004.8Article

Defect energy levels of the As-As dimer at InGaAs/oxide interfaces: A first principles studyMICELI, Giacomo; PASQUARELLO, Alfredo.Microelectronic engineering. 2013, Vol 109, pp 60-63, issn 0167-9317, 4 p.Article

Sol―gel synthesis and luminescent properties of SiO2/Zn2SiO4 and SiO2/Zn2SiO4:V composite materialsEL GHOUL, J; OMRI, K; EL MIR, L et al.Journal of luminescence. 2012, Vol 132, Num 9, pp 2288-2292, issn 0022-2313, 5 p.Article

Electronic properties of interfaces and defects from many-body perturbation feature theory: Recent developments and applicationsGIANTOMASSI, M; STANKOVSKI, M; SHALTAF, R et al.Physica status solidi. B. Basic research. 2011, Vol 248, Num 2, pp 275-289, issn 0370-1972, 15 p.Article

Investigation of a-Si (N+)/c-Si (P) hetero- junction solar cell through AFORS-HET simulationWANG, J. Q; MENG, F. Y; FANG, Z. D et al.Surface and interface analysis. 2011, Vol 43, Num 9, pp 1211-1217, issn 0142-2421, 7 p.Article

Effects of surface passivation during atomic layer deposition of Al2O3 on In0.53Ga0.47As substratesLAMAGNA, L; FUSI, M; SPIGA, S et al.Microelectronic engineering. 2011, Vol 88, Num 4, pp 431-434, issn 0167-9317, 4 p.Conference Paper

Catalytic pyrogenation synthesis of C/Ni composite nanoparticles: controllable carbon structures and high permittivitiesLU, B; HUANG, H; DONG, X. L et al.Journal of physics. D, Applied physics (Print). 2010, Vol 43, Num 10, issn 0022-3727, 105403.1-105403.6Article

Dislocations in charge-ordered Pr0.5Ca0.5MnO3 epitaxial thin films prepared by a two-step growth techniqueZHU, Y. L; WANG, X; ZHUO, M. J et al.Philosophical magazine letters. 2010, Vol 90, Num 5, pp 323-336, issn 0950-0839, 14 p.Article

Strains and rotations in thin deposited filmsHIRTH, J. P; POND, R. C.Philosophical magazine (2003. Print). 2010, Vol 90, Num 23-24, pp 3129-3147, issn 1478-6435, 19 p.Article

On ultra-thin oxide/Si and very-thin oxide/Si structures prepared by wet chemical processPINCIK, E; KOBAYASHI, H; HIGASHI, Y et al.Applied surface science. 2010, Vol 256, Num 19, pp 5757-5764, issn 0169-4332, 8 p.Conference Paper

Influence of defects on mechanical properties of bicrystal copper grain boundary interfacesWANG, L; ZHANG, H. W; DENG, X et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 13, issn 0022-3727, 135304.1-135304.12Article

Lattice mismatch and crystal growth of monoclinic KY1-xYbx (WO4)2/KY(WO4)2 layers by liquid phase epitaxySILVESTRE, O; AZNAR, A; SOLE, R et al.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 22, issn 0953-8984, 225004.1-225004.10Article

TEM analysis of the interfacial defects in the superconducting C-doped MgBz wiresKANG, S. G; CHUNG, J.-K; PARK, S. C et al.Physica. C. Superconductivity. 2008, Vol 468, Num 15-20, pp 1836-1839, issn 0921-4534, 4 p.Conference Paper

SnO2/In2O3 one-dimensional nano-core-shell structures : Synthesis, characterization and photoluminescence propertiesLI, Y; XU, G; ZHU, Y. L et al.Solid state communications. 2007, Vol 142, Num 8, pp 441-444, issn 0038-1098, 4 p.Article

Phosphorus doping of Si nanocrystals : Interface defects and charge compensationSTEGNER, A. R; PEREIRA, R. N; KLEIN, K et al.Physica. B, Condensed matter. 2007, Vol 401-02, pp 541-545, issn 0921-4526, 5 p.Conference Paper

Improvement in electrical properties of hafnium and zirconium silicates by postnitridingITO, T; KATO, H; NANGO, T et al.Journal of physics. Condensed matter (Print). 2006, Vol 18, Num 26, pp 6009-6016, issn 0953-8984, 8 p.Article

Shell-like structure of valence band orbitals of silicon nanocrystals in silica glassKROLL, Peter; SCHULTE, Hendrik J.Physica status solidi. B. Basic research. 2006, Vol 243, Num 6, issn 0370-1972, R47-R49Article

Defect layer in SiO2-SiC interface proved by a slow positron beamMAEKAWA, M; KAWASUSO, A; YOSHIKAWA, M et al.Physica. B, Condensed matter. 2006, Vol 376-77, pp 354-357, issn 0921-4526, 4 p.Conference Paper

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